newsfilter
← Latest News
ACCESS Newswire·

Aehr Receives Follow-On Order for Fully Automated Wafer-Level Burn-In Systems Powering AI Optical I/O and Data Center Interconnects

FREMONT, CA / ACCESS Newswire / March 3, 2026 / Aehr Test Systems , a leading provider of test and burn-in solutions for semiconductor devices used in artificial intelligence , data center, automotive,